“Aberration-Corrected TEM in the UT System”
Dr. Miguel Yacaman
Professor and Chair of Physics and Astronomy, UT San Antonio
Abstract
In this talk we will review some of the recent advances in TEM and STEM microscopy using spherical aberration-corrected microscopes. We will show that many advances are being produced by the possibility of using a resolution below 0.1 nm. Applications to nanotechnology will be discussed. Finally we will discuss the new TEM facility at UTSA in which the first aberration-corrected machine will be located .
Bio
Dr. Miguel Jose Yacaman has done research in many areas of physics and nanotechnology, particularly the synthesis and characterization of new materials, most of them nanoparticles, surfaces and interfaces, defects in solids, electron diffraction and imaging theory, quasicrystals, archaeological materials and catalysis. Dr. Yacaman has more than 400 publications and his work has been extensively cited. He has received, among many other honors, the National Prize in Exact Sciences of the Mexican Academy of Sciences, the National Prize of Sciences in Mexico, the Melh Award and Distinguished Lecture of the U.S. Metals and Materials Society and a Guggenheim Fellowship. He is also a fellow of the American Physical Society. Dr. Yacaman received his Ph.D. in materials science from the National Autonomous University of Mexico and did postdoctoral work at the University of Oxford and at NASA’s Ames Research Center.
