Featured Faculty Member
Dr. Chadwin Young
Dr. Chadwin D. Young earned his BS degree in electrical engineering from The University of Texas at Austin in 1996 and his MS and PhD in electrical engineering from North Carolina State University in 1998 and 2004, respectively. In 2001, he joined SEMATECH (Semiconductor Manufacturing Technology) where he completed his dissertation research on high-k gate stacks and continued this research at SEMATECH working up to senior member of the technical staff on electrical characterization and reliability methodologies for the evaluation of high-k gate stacks on current and future device architectures.
He joined the Jonsson School’s Departments of Materials Science and Engineering and Electrical and Computer Engineering in August 2012 where he researches electrical characterization and reliability methodologies for the evaluation of future materials and devices.
Young has authored or co-authored more than 310 journal, conference and invited papers. He is a National Science Foundation CAREER Award recipient and currently leads an NSF Research Experience for Undergraduates (REU) in electronic materials and devices for use in energy, electronics, nanotechnology and sensing/detecting. In addition, he has innovated new course offerings, interacted with undergraduate education entities and conducted K-12 outreach to increase a diverse, innovative and globally competitive workforce in semiconductor manufacturing.
He has chaired or served on the management or technical program committees of IIRW (International Integrated Reliability Workshop), IRPS (International Reliability Physics Symposium), SISC ( Semiconductor Interface Specialist Conference), IEDM (International Electron Devices Meeting), ICMTS (International Conference on Microelectronic Test Structures) SNW; as guest editor for IEEE (Institute of Electrical and Electronics Engineers) Transactions on Device and Materials Reliability; and as a peer reviewer for several journals. He is currently a senior member of IEEE and serves as a Device Reliability Physics Committee member of the IEEE Electron Device Society.
Young says his advice to students – always be truthful, always be honorable, never stop trying – comes from a poem by Rudyard Kipling called “If.”