2025 Spring Featured Research

Revolutionizing Space Electronics Testing: “Two-Photon Absorption Laser System Enhancements for Maximizing Throughput and Value for Single Event Effects Characterization”

Single-Event Effects (SEEs) pose a significant reliability challenge for space
electronics. To assess the space-worthiness of Integrated Circuits (ICs), they must generally be tested with highly accelerated ion beams from particle accelerator facilities. Unfortunately, with recent boom in the commercial space development, current demand far outstrips the supply – there are only 4 U.S. facilities capable of producing the ion beams required for space qualifications. The limited availability of such facilities is a significant bottleneck in the ability to characterize ICs required for space applications

To address this limitation, the DOD has funded a five-year project (2024-2029) led by Dr. Robert Baumann (Director, Radiation Effects and Reliability) and Dr. Rodolfo Rodriguez Davila (Research Scientist, TPA Technical Lead), of the University of Texas at Dallas, to develop a ground-breaking two-photon (TPA) laser-based system for characterizing SEEs in ICs. This innovative system replicates the spatial and temporal characteristics of heavy ion events, enabling efficient and reliable testing of ICs without needing a heavy ion beam. This project will allow high fidelity SEE characterizations of space electronics to be performed at UTD’s Center for Harsh Environment Semiconductors and Systems (CHESS).

Key Thrusts:

1) Develop a Robust Laser System: Design and implement a reliable TPA laser system with optimized optics, pulse width, and intensity to emulate heavy ion events and offer a scan rate allowing an entire IC to be characterized within tens of minutes – similar in duration to ion accelerator tests.
(2) Correlate Laser-Induced SEEs with Ion Beam SEEs: Establish methodologies to directly compare the effects of laser pulses and heavy ion events and confirm that the TPA laser pulse closely mimics the spatial and temporal attributes of events produced by a single heavy ion.
(3) Investigate permanent damage: Utilize optical spectroscopy to analyze the extent of damage caused by SEEs, including interface and bulk trap creation.
(4) Foster Workforce Development: Develop a targeted training and certification program to equip students and engineers with the knowledge and skills needed to address radiation effects and reliability in space electronics.

By advancing this laser-based SEE testing technology, UTD researchers are contributing to the development of more reliable and resilient space electronics that will support the development of new orbital platforms and constellations as well as new missions to the moon, mars, and beyond.

Dr. Kyeongjae Cho (KJ)

Dr. Kyeongjae Cho and PhD student, Matthew Bergschneider at the University of Texas at Dallas and other researchers, have identified the reason behind the degradation of lithium nickel oxide (LiNiO2) batteries, a potential material for next-generation lithium-ion batteries. The team discovered that a chemical reaction involving oxygen atoms in LiNiO2 leads to instability and cracking. To address this, they proposed reinforcing the material by adding a positively charged ion, creating “pillars” to strengthen the cathode. This breakthrough could remove a key barrier to the widespread use of LiNiO2 batteries.

Assistant Professor Kanad Basu, Dr. Robert Baumann and Dr. Rodolfo Rodriguez Davila’s Groups:

Blast Off! Unveiling the Secrets of Microcontrollers in Space

Assistant Professor Kanad Basu (ECS), Dr. Robert Baumann (Director of Radiation Effects and Reliability at CHESS/MSE), and Dr. Rodolfo Rodriguez Davila (Research Scientist, CHESS/MSE) are guiding Abhinay Dwadasi (ECS) on a mission to conquer the harsh realities of space for microcontrollers (MCUs). Abhinay’s master’s thesis, fueled by a generous gift from Texas Instruments’ MCU business unit, delves into the impact of heavy ion single event effects (SEEs) on these vital components.

MCUs are the brains behind countless systems, from everyday appliances to cutting-edge spacecraft. In orbit, they control power, process sensor data, and manage motors—essential tasks for any space mission. But the space environment is a hostile place. Bathed in a constant barrage of high-energy particles, MCUs face a relentless threat.

Imagine particles with energies millions, even billions, of electron volts! They easily pierce spacecraft shielding and wreak havoc on sensitive electronics. While Lower Earth Orbit (LEO) is nteeming with energetic electrons and protons, it’s the rarer, heavier ions that pose the greatest threat to MCUs. These cosmic bullets can cause data glitches, memory errors, unexpected resets, and even catastrophic failures.

To unravel these cosmic mysteries, Abhinay is harnessing the power of the Texas A&M University Cyclotron Institute’s heavy ion beams. These ion beams simulate the punishing radiation of space, accelerating experiments and allowing researchers to pinpoint MCU weaknesses and predict on-orbit failure rates. Check out the image of the MCU evaluation board with the MCU die exposed to the heavy ion beam (coming from the aluminum tube on right), and the photo of TI MCU expert Harish Janakiraman (who provided critical technical insight / support for this project), Dr. Baumann, and Abhinay during a recent test campaign!

This is just the beginning! With secured funding for instrumentation and beam time, the team is poised to expand the research, developing and refining new test methods for a wide range of MCUs. Calling all aspiring space system electronics experts! If you’re a recent engineering or physics graduate with a passion for digital systems, PCBs, programming, and a solid foundation in digital and analog electronics, and you dream of pushing the boundaries of space exploration and spacecraft development, Dr. Baumann (robert.baumann@utdallas.edu) wants to hear from you!